In an exemplary embodiment, a pattern is recognized from digitized images. A first image metric is computed from a first digitized image and a second image metric is computed from a second digitized image. A composite image metric is computed as a function of the first image metric and the second image metric, and a pattern is identified by comparing the composite image metric against a reference image metric. The function may be a simple average or a weighted average. The image metric may include a separation distance between features, or a measured area of a feature, or a central angle between two arcs joining a feature to two other features, or an area of a polygon whose vertices are defined by features, or a second moment of a polygon whose vertices are defined by features. The images may include without limitation images of friction ridges, irises, or stars.
This information is part of a study by Oasis Global, Inc. of all space inventions filed at the United States Patent and Trademark Office, and is provided for informational purposes only. It is not an endorsement of any particular assignee, inventor or invention. Although Peter A. Koziol represents inventors and assignees of space inventions he does not represent all of the inventors and assignees listed. The prosecuting attorney agent or firm for each patent is identified by the United States Patent and Trademark Office in the patent specfication, which can be viewed by clicking on the patent image or downloading the patent document. For more information regarding Mr. Koziol's background and experience, or to learn more about space inventions, please contact Mr. Koziol.
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